The separation and identification of trace components in industrial products is a well known analytical problem, particularly if they elute in low concentrations close to the major component. Current methods fail due to insufficient resolution and or the detection limits of existing systems.
In this paper the potential of a combination of programmed temperature sample introduction and dual oven multicolumn switching for the determination of trace impurities in industrial intermediates, is discussed and demonstrated on three examples.
It will be shown that a reliable identification of trace amounts of impurities in these industrial products is possible, with a fully optimized multi column switching system, without interference of the major components.
